Power Math for Power Circuits
Desktop Engineering, October 2006
How Maple’s 3D capabilities helped solve the mystery of gate resistance on shoot through
Alan Elbanhawy, a director at Fairchild Semiconductor International, examined the effects of lumped and distributed gate resistance on the phenomenon of shoot through (also known as cross conduction) in synchronous buck.
He concludes: “Using Maple allowed us to investigate the interaction of all the important parameters in 3D representations that helped us understand the extent of the interdependencies. The 3D capability offers a very powerful visualization tool of the complete results. To achieve the same results using any other numerical simulation environment requires enormous amount of batch simulation, data compiling, and graphing.”
Read full article: Maple's 3D capabilities (262 KB .pdf file)